The JEOL JEM 3200FS is a 300 kV transmission electron microscope (TEM) equipped with a thermal field emission gun (FEG) and an anti-contaminator that allows it to record images when the specimen is held at liquid nitrogen temperatures. Our 3200FS is also equipped with an in-column energy filter and the hardware necessary for bright field and high angle annular dark field scanning transmission electron microscopy (BF- and HAADF-STEM).
View additional details of the JEOL JEM 3200FS at the EMC
The following panels link to pages with more detailed resources on these imaging techniques: