Training for some of the equipment in the EMC may only be initiated after certain milestones have been reached. These involve a certain level of expertise with one microscope before advancing to a new one, competence with certain skills before moving to more advanced uses of the equipment, etc. This page describes these milestones.
Requirements for Training on EMC Equipment
Imaging Tools
JEOL JEM 1010
Aside from the need to use a transmission electron microscope (TEM), there are no requirements to begin training on the 1010.
JEOL JEM 1400plus
After a user has been trained to use the 1010 and has used it long enough to develop some expertise, a request for training on the 1400plus can be made using the "Equipment Use (Training)" area on the EMC's iLab Service Request page. Before that training can actually begin, the user must be able to show the following skills using the 1010:
- use of the sample holder and the goniometer.
- knowledge of the vacuum system (including valve locations on both the instrument and in the vacuum system diagram) and normal readings for the valves and gauges.
- control of the illumination system using the brightness knob, beam shift controls and spot sizes.
- understanding and use of the focus knobs, the x/y wobblers and objective lens stigmators.
- alignment of condenser and objective aperatures.
- use of the Gatan MegaScan 794 CCD camera (including the live FFT function).
JEOL JEM 3200FS
Once a user has been trained to use the 1400plus and shows both some expertise with it and a need for any of the capabilities of the 3200FS that cannot be duplicated using the 1400plus, a request for training on the 3200FS can be made using the "Equipment Use (Training)" area on the EMC's iLab Service Request page. Before that training can actually begin, the user must be able to show the following skills using the 1400plus
- alignment of the instrument starting at conditions set by the staff.
- ability to record a close-to-focus image at 100,000x (or higher) that shows multiple Thon rings and no astigmatism.
FEI Teneo VolumeScope
Content coming soon...
Specialized TEM Holders
Content coming soon...
Sample Preparation Equipment
Content coming soon...