This description is a work in progress...
Our JEOL NEOARM (similar to the one shown in this image from the JEOL USA website) was installed in the summer of 2024. It is an intermediate voltage (200 kV) transmission electron microscope (TEM) equipped with scan coils and detectors for bright-field (BF) and high angle annular dark-field (HAADF) scanning transmission electron microscopy (STEM). This type of instrument is often described as a (S)TEM or S/TEM to indicate that it has both TEM and STEM capabilities.
The main camera for TEM is a 4k x 4k CMOS-based Gatan OneView camera. It is also equipped with a Gatan energy filter (GIF) with a ??? camera for energy-filtered imaging as well as electron energy loss spectroscopy (EELS).
The NEOARM uses a cold-FEG to produce the electron beam and can be operated at voltages between 30 and 200 kV. It also has an ASCOR Cs aberration corrector that allows atomic resolution STEM imaging a lower voltages.
Various documents concerning the NEOARM can be found here.