Here is a table with the nominal magnifications of the JEOL JEM 1010 and the corresponding calibrated (or calculated) pixel sizes and magnifications for the MegaScan 794 CCD camera.
For the direct calibrations, multiple images of a replica diffraction grating (a so-called waffle grid) were recorded using the MegaScan 794 and transferred to a computer running serialEM. Averages and standard deviatons for the pixel size at each magnification were determined using serialEM, based on either the spacing of the replica diffraction grating or the spacing between grid bars of the copper grid.
*These pixel sizes and magnifications are extrapolated by DigitalMicrograph based on the directly calibrated values. For the pixel sizes extrapolated by DigitalMicrograph, standard deviations do not exist. This fact is flagged with NA (not available).
Due to the small field of view of the MegaScan 794 camera, and the camera's large pixel size (24 μm), it is impossible to calibrate the camera at magnifications higher than 25,000x using the spacing of the replica diffraction grating: there is less than an entire waffle square in a single image. Magnifications above 120,000x (where the 1010 has issues with brightness and overall performance) could possibly be calibrated using the atomic spacings of graphite (0.344 nm), but this has not been done at this time. The Electron Microscopy Center (EMC) staff is working on ways to calibrate better the magnifications and pixels sizes for all the magnifications above 25,000x, and will let users know when things change. The staff has shown that the extrapolated values shown in the table above are reasonable.
NOTE: The pixel sizes shown in this chart were determined in March, 2022. Further attempts to calibrate the camera are likely to change some of these values. The EMC staff will let users know if this happens.
