Simon Hall 047D
Xun Zhan is an assistant research scientist in the electron microscopy center (EMC) at Indiana University Bloomington, where Xun provides TEM support for materials science applications, including maintaining and operating microscopes and related equipment; interacting and training users in the use of JEOL 1400Plus and JEOL 3200FS that focused on materials science applications, such as: 1) bright/dark/weak-beam dark field imaging and high-resolution TEM imaging. 2) Diffraction techniques including selective area electron diffraction (SAED), nano-beam electron diffraction (NBED), convergent-beam electron diffraction (CBED), and scanning electron nano-diffraction (SEND). 3) Scanning TEM (STEM) including high angle annular dark field (HAADF) and annular bright field (ABF) imaging, X-ray energy dispersive spectroscopy (XEDS) and electron energy loss spectroscopy (EELS); participating in methods development for in-situ TEM using Protochips Fusion select heating holder and DE64 detector, as well as 4D STEM.
Xun received her master degree from Institute of Metal Research, Chinese Academy of Sciences in 2012, working with Prof. Yanchun Zhou on high temperature plastic deformation dislocation evolution mechanism of Ti3AlC2 using weak-beam dark field techniques. She obtained her PhD from Case Western Reserve University in 2017, working with Prof. Frank Ernst on crystallization micro-mechanism of amorphous Ni-P alloy, using conventional TEM, STEM, XEDS, EELS and SEND. She had two years’ postdoctoral research experience, working with Prof. Jian-min Zuo at University of Illinois at Urbana-Champaign on Li-ion battery cathode materials LiMn2O4 intercalation mechanism upon discharge, using probe aberration corrected STEM, XEDS, strain mapping techniques based on SEND and template matching (TeMA), as well as monochromated-EELS in STEM.
Xun is available for training new users and providing fee-for-service on JEOL 1400Plus and JEOL 3200FS. You can reach Xun at email@example.com.