Proving TEM Proficiency Using the JEOL JEM 1010

People wanting to use the JEOL JEM 3200FS need to be trained on the JEOL JEM 1010 in the Myers Hall EM area and should contact Barry Stein to start training.

In order to make training on the 3200FS as simple possible, people who want to use the 3200FS must show a basic understanding of how an electron microscope works and must be familiar with a variety of concepts and operations that can be learned on the 1010. To show that a user has an adequate level of understanding and proficiency, the following skills test must be completed before training on the 3200FS can begin. The first block of questions can be answered verbally with Barry. The second block requires a user to record a series of images using the CCD camera on the 1010. These images must be saved in dm3 format and made available to David Morgan.

         The following items are intended to show that a user understands enough about the general principles of electron microscopy and about the operation of the JEOL JEM 1010 electron microscope in Myers Hall to start training on the JEOL JEM 3200FS in Simon Hall.  The first tweleve items listed below are things that need to be discussed with or demonstrated to Barry Stein and the remainder involve images that need to be recorded and saved.

  1. Does the user know the fundamental differences between tungsten, LaB6 and field emission gun (FEG) electron sources?
  2. Can the user explain the advantages and disadvantages of 100 vs 300 kV accelerating voltages?
  3. Can the user explain the role of the condenser and objective apertures in an electron microscope and align the objective aperture in the 1010?
  4. Can the user turn on/off the filament and HT properly, and tell when the filament is properly saturated?
  5. Can the user explain how to change the accelerating voltage?
  6. Can the user correctly load grids into the specimen holder?
  7. Can the user correctly insert and remove the specimen holder from the 1010?
  8. Can the user look at the microscope and determine microscope parameters such as accelerating voltage, stage position & tilt, spot size and vacuum status?
  9. Can the user insert and retract the CCD camera and explain why this is important?
  10. Does the user know the standard procedure for finding a “lost” electron beam?
  11. Can the user adjust the z-axis in the goniometer properly?  This adjustment should be used for item 15 below.
  12. Can the user demonstrate the procedure needed for recording electron diffraction patterns?

The following items deal with recording images using the Gatan CCD camera.  These images should be recorded using a magnification between 20,000x and 50,000x and should be unbinned unless otherwise indicated.  Please save all the images needed for the following demonstrations and provide a copy of the DigitalMicrograph images (dm3 files) to the person training you on the 3200FS:

  1.  Determine the width of the field of view for images recorded on the CCD camera at two different magnifications.
  2.  Record an image that is close to focus.  Then record a pair of images that are defocused by the same amount in both the underfocus and the overfocus directions.  The amount of defocus should be enough for the overfocus image to be significantly overfocus.
  3.  Record an untilted image and images of the same field of view that are tilted 30° in both the positive and negative directions.
  4.  Record an image that has been deliberately made astigmatic and the same image after correcting the astigmatism.
  5.  Record a series of images of the same field of view where the binning increases from unbinned to binned by 4.
  6.  Record a series of 4 images where the electron dose is cut in half between each successive image.