STEM EDS
EELS
STEM / EELS
Electron Diffraction
STEM / EDS

Under Construction!

The JEOL JEM 3200FS is a 300 kV transmission electron microscope (TEM) equipped with a thermal field emission gun (FEG) and an anti-contaminator that allows it to record images when the specimen is held at liquid nitrogen temperatures. Our 3200FS is also equipped with an in-column energy filter and the hardware necessary for bright field and high angle annular dark field scanning transmission electron microscopy (BF- and HAADF-STEM). Details of the instrument itself can be found here.

The folllowing paragraphs briefly describe the types of imaging that this hardware allows and provide links to further information about each of them.

Scanning Transmission Electron Microscopy (STEM) -

Energy Dispersive X-Ray Spectroscopy (EDS or EDX) -

Electron Energy Loss Spectroscopy (EELS) -

STEM / EELS -

STEM / EDS -

Electron Diffraction - Electron diffraction is clearly not an imaging mode for an electron microscope. It also differs significantly from the techniques listed under nanoscale analysis in that every TEM is capable of electron diffraction (i.e., no additional equipment such as scanning coils, annular detectors or an energy filter is needed). Thus electron diffraction falls into the grey area outside of imaging or (further info...)