Microscopes in the EMC

 

photo of 1010

JEOL JEM 1010
Myers Hall 040

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photo of 3200FS

 

JEOL JEM 3200FS
Simon Hall 032

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JEOL JEM 1400plus image from JEOL USA website

JEOL JEM 1400plus
Myers Hall 040

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Additional equipment and core resources
complementary to the Electron Microscopy Center.

image of Zeiss Auriga 60 dual beam FIB/SEM

Zeiss Auriga 60

Simon Hall 034

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image of JEOL JSM 5800LV

Light Microscopy
Imaging Center

Myers Hall 059

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image of FEI Quanta 600F environmental SEM

Nanoscience
Characterization
Facility

Simon Hall 034

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image of JEOL JSM 5800LV NOTE: The JEOL JSM 5800LV was retired in early December 2016, and sent to IU Kokomo. Anyone who needs the large sample chamber available on this SEM should contact Christian Chauret about using the instrument. For routine SEM work, contact Barry Stein about the use of the FEI Quanta 600F in the Nanoscale Characterization Facility.